
Analyzer SIPAN 32, SIPAN 32X and SIPAN 34
Siemens PA 20 · 1999
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Mode of operation
MeasuredĆvalue processing
The signals delivered by the analog input amplifiers are
processed into a temperatureĆcompensated value by the
digital data processing function.
Conductivity
With all three measuring procedures (2EL, 4EL and IND), a
squareĆwave or sineĆwave AC voltage is applied to the
sensors. The magnitude and frequency depend on the
measuring procedure. The current output by the sensor is a
measure of the conductivity of the medium.
Temperature compensation
Either Pt 100 or Pt 1000 thermometers can be connected to the
analyzers. The measurement is designed as a threeĆwire
system. The type of thermometer connected is recognized
automatically.
Cleaning function (option with SIPAN 34)
3 relay contacts can be triggered via a timer in order to control
a changeover fitting and to apply cleaning and flushing
solutions.
Ex protection (SIPAN 32X)
Analyzers with type of protection "Increased intrinsic safety"
EEx ia can be mounted in potentially explosive atmospheres
(zone 1). The conformity certificate corresponds to the
European standard (CENELEC).
Parameter sets (option)
The analyzer contains complete parameter sets for 4 methods
which can be set independent of one another. Thus optimum
adaptation is possible in a process in which different media are
to be measured in succession in one line. Selection of the
respective parameter set can be controlled externally.
Depending on the parameter settings of the analyzer, the
following functions are executed in addition to output of the
measured value:
SIPAN
Functions
32,
32X
34
Output of measured signal and temperature on the
display
X X
Output of measuring range and trend on the
display
X
Switching of respective parameter set onto the
display
X
Conversion of measured signal into % w/w X X
Output of temperature via the second current output X X
Limit monitoring X X
Monitoring of sensor X X
Digital communication via the interface X
Diagnostic functions X X
Cleaning and timer function X X
PI controller X
Software clock X X
Logbook X X
Illuminated display X
Output of measuringĆpoint name on the display X
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